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Ti_3SiC_2与TiAl的显微结构与电子结构研究(英文) MicrostructureandElectronicStructureAnalysisofTi3SiC2andTiAl Introduction Thedevelopmentofadvancedmaterialswithuniquepropertieshasbeenoneofthemostsignificantchallengesinmaterialscience.Titaniumanditsalloysarewidelyusedinaerospace,automotive,andbiomedicalindustriesbecauseoftheirexcellentstrengthandcorrosionresistance.Ti3SiC2andTiAlaretwopromisingmaterialsthatareknowntopossessexceptionalmechanical,thermal,andelectricalproperties.Inthispaper,weaimtostudythemicrostructureandelectronicstructureofthesetwomaterials. MicrostructureAnalysis Ti3SiC2isaternarycompoundthatbelongstotheMAXphasefamilyofmaterials.ThecrystalstructureofTi3SiC2ishexagonal,withaspacegroupofP63/mmc,andlatticeparametersa=3.083Åandc=20.065Å.TheunitcellofTi3SiC2containsthreeTi,oneSi,andtwoCatoms.Ti3SiC2hasalayeredstructurewithaMAXphaselayerandagraphenelayer.TheMAXphaselayeriscomposedofTiatoms,Catoms,andaSiatomthatsitsinthemiddle.ThegraphenelayerisformedbytheweakVanderWaalsforcebetweentheMAXphaselayers.ThemicrostructureofTi3SiC2canbefurtheranalyzedthroughtransmissionelectronmicroscopy(TEM).IthasbeenobservedthatTi3SiC2possessesafine-grainedmicrostructure,andthelatticefringesarewell-defined.TheTEMimagesshowthepresenceoftwinboundariesandstackingfaultsinTi3SiC2,whichmayaffectitsmechanicalproperties. TiAlisanintermetallicalloythatiscomposedofTiandAl.TiAlhasaB2crystalstructurewithaspacegroupofPd3m.ThelatticeparameterofTiAlis3.580Å.TheunitcellofTiAlcontainstwoTiandtwoAlatoms.TiAlexhibitsanorderedcrystalstructure,whichprovidesitwithexcellentductilityandfracturetoughness.ThemicrostructureofTiAlcanbestudiedbyusingscanningelectronmicroscopy(SEM)andTEM.TheSEMimagesshowthatTiAlhasalamellarmicrostructure,whichisformedbyalternatinglayersofTiandAl.TheTEMimagesrevealthatTiAlhasafine-grainedmicrostructure,whichisbeneficialforitswearresistance. ElectronicStructureAnalysis Theelectronicstructureofamaterialisanessentialfactorthatdeterminesitsphysicalandchemicalproperties.TheelectronicstructureofTi

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