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Si-SiGe材料三维CMOS集成电路技术研究(英文) ResearchonThree-dimensionalCMOSIntegratedCircuitTechnologyBasedonSi-SiGeMaterial Abstract: Inthefieldofmicroelectronics,thecontinuousdevelopmentofintegratedcircuittechnologyhasgreatlypromotedthedevelopmentofartificialintelligence,theInternetofThings,andotherindustries.Asanimportantmaterialinintegratedcircuittechnology,Si-SiGehasuniqueadvantagesindeviceperformance.BasedonthecharacteristicsofSi-SiGematerial,thispaperintroducesthebasicprinciplesandresearchprogressofthree-dimensionalCMOSintegratedcircuittechnology.Throughthediscussionofthelatestresearchachievements,wecanunderstandthepotentialofSi-SiGematerialinthefieldofintegratedcircuittechnology. Keywords:Si-SiGematerial,Three-dimensionalCMOSintegratedcircuit,Deviceperformance Introduction: Si-SiGematerialisaternarycompoundmaterialcomposedofsilicon,germanium,andcarbonatoms.Comparedwithtraditionalsiliconmaterials,Si-SiGehasahighercarriermobilityandsmallerleakagecurrent,whichcaneffectivelyimprovetheperformanceofdevices.Therefore,Si-SiGematerialhasgraduallybecomeanimportantresearchdirectioninthefieldofmicroelectronics.Three-dimensionalCMOSintegratedcircuittechnologyisoneofthehotspotsinthecurrentresearchfieldofintegratedcircuittechnology.Bystackingmultipledevicelayersvertically,thechipareacanbeeffectivelyreduced,andthedeviceperformancecanbeimproved.Therefore,Si-SiGematerialhasbecomearesearchhotspotinthefieldofthree-dimensionalCMOSintegratedcircuits. MainContent: 1.ThebasicprinciplesofSi-SiGematerials Si-SiGeisacrystalmaterialwithadiamondstructure,anditslatticeconstantishigherthanthatofsilicon.TheadditionofgermaniumatomsinSi-SiGecaneffectivelyreducetheenergybandgapofthematerial,increasethecarriermobility,andreducethethresholdvoltageofthedevice.Inaddition,theincorporationofcarbonatomscaneffectivelyreducetheleakagecurrentofthematerial.Therefore,Si-SiGematerialhasexcellentdeviceperformanceandiswidelyusedinhigh-enddevices. 2.TheresearchprogressofSi-SiGematerialsinCMOSintegratedcircuits Withtherapidd

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