用于存储器测试的“透明”的可编程BIST方法(英文)-豆柴文库

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用于存储器测试的“透明”的可编程BIST方法(英文)
Introduction
Intheelectronicsindustry,acriticalcomponentofelectronicdevicesandsystemsisthememory.Inordertoensurethatmemorycomponentsarefunctioningproperly,extensivetestingmustbeperformed.Built-inSelfTest(BIST)isanessentialmethodfortestingmemories.Itisatechniquethatallowsthememorytotestitselfwithoutneedinganexternaltester.Themethodisafaster,moreefficient,andlessexpensivewaytotestmemories,anditallowsforearlydetectionandrepairoffaults.Inthispaper,wewilldiscussTransparentProgrammableBISTasamethodfortestingmemories.
WhatisTransparentProgrammableBIST?
TransparentProgrammableBISTisaBISTmethodthatoffersmanyadvantagesovertraditionalBISTmethods.Itisasimple,easy-to-usetechniquethatcanbeimplementedinbothlogicandmemorydevices.Itallowsforcomprehensivetestingofmemories,withoutaddingsignificantoverheadtothedevice.TheTransparentProgrammableBISTtechniqueisamethodwheretheprogrammedfunctionalityistransparenttothememorysystemandisdonewithouttheknowledgeofthememorysystem.
TheTransparentProgrammableBISTtechniqueincludesasetoftestmodesthatfocusonspecificmemoryparameters.Thetechniqueusesashiftedtestsequencetotestindividualmemorycellsinthememoryarray.Thetestsequenceisshiftedtodifferentlocationsofthememoryarray,allowingeachcelltobetestedfordifferentparameters.Thetechniquealsoincludesaprogrammabletestmodethatcanbeusedtotestspecificfunctionalparametersofthememory.
AdvantagesofTransparentProgrammableBIST
TheTransparentProgrammableBISTtechniqueoffersmanyadvantagesovertraditionalBISTmethods.First,itoffersflexibilityintesting,allowingfortargetedtestingofspecificmemoryparameters.Thetechniqueallowsforcompletetestingofthememory,eliminatingtheneedforexternaltesters.Inaddition,thetechniqueistransparenttothememorysystem,whichallowsforthecontinueduseofthememorywhiletestingisunderway.
AnotheradvantageofTransparentProgrammableBISTisitseaseofuse.Thetechniqueiseasytoimplement,anditdoesnotrequiremuchoverheadinthedesignofthedevice.Itisasimpletechniquethateasilyfitsintothedesignofanyme