应用系统级ATE测试增进IC设计验证效率(英文).docx 立即下载
2024-12-03
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应用系统级ATE测试增进IC设计验证效率(英文).docx

应用系统级ATE测试增进IC设计验证效率(英文).docx

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应用系统级ATE测试增进IC设计验证效率(英文)
Abstract:
Application-specificintegratedcircuits(ASICs)needtobetestedfortheirfunctionalityandperformancetoensurethattheycomplywiththerequiredspecifications.ThetestingprocessisacrucialstepintheASICdesignandmanufacturingprocess,asitisanessentialpartofverifyingthedesignandensuringthattheproductmeetstherequiredqualitystandards.Thetestingprocessistypicallyperformedusingautomatedtestequipment(ATE),whichrunsaseriesoftestsontheASICtodetermineifitmeetsspecificrequirements.
ThispaperdiscussestheuseofSystem-levelATEtestingtoenhanceICdesignverificationefficiency.ThepaperaimstoprovideanoverviewoftheATEtestingprocessanditssignificanceinASICdesignandmanufacturing.Thispaperhighlightsthebenefitsofusingsystem-levelATEtestingandprovidesexamplesofusecaseswheresystem-leveltestingcanenhanceICdesignverificationefficiency.
Introduction:
ThedemandforASICsisincreasingasmoreelectronicdeviceswithspecializedfunctionalityrequirecustom-builtchips.ASICdesignandmanufacturingarecomplexprocessesthatinvolveaseriesofsteps,fromdesigntotesting.TestingisacrucialstepintheASICdesignprocessasitensuresthattheASICmeetstherequiredspecificationsandfunctionality.
Thetestingprocessistypicallyperformedusingautomatedtestequipment(ATE),whichrunsaseriesoftestsontheASICtodetermineifitmeetsspecificrequirements.TheATEtestingprocessinvolvesaseriesoftests,includingfunctionaltests,productiontests,reliabilitytests,andsystem-leveltests.
System-levelATEtestingisanessentialpartoftheASICdesignandmanufacturingprocess.System-leveltestinginvolvestestingtheASICinasimulatedsystemenvironment.ThistypeoftestingensuresthattheASICmeetstherequiredfunctionalityandperformancerequirementsandiscompatiblewiththesystem'sothercomponents.
Benefitsofsystem-levelATEtesting:
System-levelATEtestingprovidesseveralbenefits,including:
1.Enhancedverificationefficiency:
System-levelATEtestingprovidesenhancedverificationefficiencybyrunningmultipletestssimultaneously.ThistypeoftestingenablestestingofallthefunctionalblocksoftheASICina
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应用系统级ATE测试增进IC设计验证效率(英文)

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