

如果您无法下载资料,请参考说明:
1、部分资料下载需要金币,请确保您的账户上有足够的金币
2、已购买过的文档,再次下载不重复扣费
3、资料包下载后请先用软件解压,在使用对应软件打开
高压脉冲功率多层瓷介电容器外部应力对可靠性影响分析研究 高压脉冲功率多层瓷介电容器外部应力对可靠性影响分析研究 摘要: 多层瓷介电容器是电子设备中应用广泛的电力储能元件,具有体积小、重量轻、电性能优良等特点。然而,高压脉冲功率的应用环境使得多层瓷介电容器面临更复杂的外部应力,导致其可靠性降低。因此,本文针对高压脉冲功率多层瓷介电容器的外部应力对其可靠性的影响进行了深入的分析研究。 首先,本文介绍了多层瓷介电容器的基本结构和工作原理,并阐述了多层瓷介电容器在高压脉冲功率环境下所面临的外部应力,包括机械应力、热应力和湿度应力等。然后,本文分别从机械强度、热稳定性和电介特性三个方面对外部应力对多层瓷介电容器可靠性的影响进行了定性与定量分析。通过实验和仿真等手段,本文得出了以下结论:高机械应力会导致瓷介电容器的压裂和断裂,进而影响其电性能;高热应力会导致瓷介电容器的介质老化和热应力脱陷,降低其绝缘性能;高湿度应力会引起瓷介电容器的内部潮湿和电解液漏泄,加速其寿命衰减。最后,本文提出了一些改善多层瓷介电容器可靠性的方法和措施,包括优化材料选择、设计结构改进和工艺参数优化等。 关键词:高压脉冲功率,多层瓷介电容器,外部应力,可靠性,分析研究 Abstract: Multi-layerceramiccapacitors(MLCC)arewidelyusedpowerstorageelementsinelectronicdevices,characterizedbysmallsize,lightweight,andexcellentelectricalperformance.However,theapplicationofhigh-voltagepulsepowerenvironmentexposesMLCCstomorecomplexexternalstresses,leadingtoreducedreliability.Therefore,thispaperconductsanin-depthanalysisandresearchontheimpactofexternalstressesonthereliabilityofMLCCsunderhigh-voltagepulsepower. Firstly,thispaperintroducesthebasicstructureandworkingprincipleoftheMLCCandelaboratesontheexternalstressesfacedbyMLCCsinhigh-voltagepulsepowerenvironment,includingmechanicalstress,thermalstress,andhumiditystress.Then,thispaperqualitativelyandquantitativelyanalyzestheimpactofexternalstressesonthereliabilityofMLCCsfromthreeaspects:mechanicalstrength,thermalstability,andelectricaldielectriccharacteristics.Throughexperimentsandsimulations,thispaperdrawsthefollowingconclusions:highmechanicalstresscanleadtocrackingandfractureofMLCCs,therebyaffectingtheirelectricalperformance;highthermalstresscancausedielectricagingandthermalstressrelaxation,reducingtheirinsulationperformance;highhumiditystresscancauseinternalhumidityandelectrolyteleakageofMLCCs,acceleratingtheiraging.Finally,thispaperproposessomemethodsandmeasurestoimprovethereliabilityofMLCCs,includingoptimizingmaterialselection,improvingstructuraldesign,andoptimizingprocessparameters. Keywords:high-voltagepulsepower,multi-layerceramiccapacitor,externalstress,reliability,analysisandre

快乐****蜜蜂
实名认证
内容提供者


最近下载