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CMOS组合电路开路故障的BIST探讨
Title:BISTInvestigationofOpenCircuitFaultsinCMOSCombinationalCircuits
Abstract:
Withtheincreasingcomplexityofintegratedcircuits,ensuringtheirreliabilityandfault-freeoperationbecomesacriticalchallenge.Onecommontypeoffaultthatfrequentlyoccursincomplementarymetal-oxide-semiconductor(CMOS)combinationalcircuitsisanopencircuitfault.ThispaperexplorestheapplicationofBuilt-InSelf-Test(BIST)techniquesinthedetectionanddiagnosisofopencircuitfaultsinCMOScombinationalcircuits.BISTprovidesaneffectiveandefficientsolutionfortestinganddiagnosingsuchfaults,leadingtoimprovedoverallreliabilityofCMOScircuits.Thepaperdiscussestheprinciplesofopencircuitfaults,examinesvariousBISTtechniquesforopencircuitfaultdetection,andevaluatestheireffectivenessintermsoffaultcoverage,overhead,anddiagnosisaccuracy.TheresultsdemonstratethesignificanceofBISTinthesuccessfuldetectionanddiagnosisofopencircuitfaults,ultimatelycontributingtotheenhancedreliabilityofCMOScombinationalcircuits.
1.Introduction
Integratedcircuitsformacentralpartofmodernelectronicsystems,enablingtheirfunctionalityandperformance.However,theincreasingcomplexityandminiaturizationofthesecircuitsalsoraiseconcernsabouttheirreliabilityandrobustness.FaultscanoccurinCMOScombinationalcircuitsduetovariousreasons,suchasmanufacturingdefects,aging,orexternalfactors.Amongthesefaults,theopencircuitfaultisacriticalissuethatcanleadtocircuitmalfunctionorcompletefailure.Therefore,itbecomesessentialtodevelopeffectivetechniquestodetectanddiagnoseopencircuitfaults.
2.OpenCircuitFaults
2.1DefinitionandCauses
Opencircuitfaultsrefertotheinterruptionintheelectricalpathbetweentheoutputandinputsofacircuitelement,resultinginadiscontinuityinsignalpropagation.Theprimarycausesofopencircuitfaultsincludedefectsinfabrication,metalfatigue,interconnectdiscontinuity,orthepresenceofforeignparticles.
2.2ImpactofOpenCircuitFaults
Opencircuitfaultscanleadtovariousdetrimentaleffects,includinglogicerrors,incorrectfunctionality,orcompletecircuitfailure.Thesefaul